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Enhanced Scenes will extend the
limited capabilities of Old Scenes. It will now be possible to create and
edit applicative data.
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Enhanced Scenes
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An enhanced scene can be seen as
an alternative view of an assembly in a defined state. It enables you to
study a variant of your mock-up by defining specific component positions
and specific attributes.
You can overload the following attributes:
- Component Positioning (using compass manipulation, snap or explode
commands)
- Component Graphical attributes (color, transparency, line type,
line thickness)
- Node Activation state
- Component Hide / show state
- Viewpoint
One of the major benefits of Enhanced Scenes is that the applicative
data container will be available and
functionalities associated with the applicative data will also be available
in Enhanced Scene context.
It will be possible to generate Enhanced Scenes from Old Scenes.
Overloading of attributes (graphical, show / no show state, etc.) is
limited to Products, i.e. these modifications are not replicated between
scene and assembly for Products, however, for parts, models and manikins
these modifications will be replicated (modifications on parts, models and
manikins are always replicated in both directions). Likewise, modifications
in Enhanced Scene context to Product attributes that are not in the above
list (of attributes that can be overloaded) will be replicated on the
assembly. |
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Overload Modes in Enhanced Scenes
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When you work in Enhanced Scenes,
there are two Overload Modes, Full and Partial.Overload Mode Full
- When you create a Enhanced Scene in Overload Mode Full, all
attributes are immediately considered overloaded.
- All subsequent modifications to the Assembly will have no impact on
the Enhanced Scene and vice-versa.
- If you choose to apply the Enhanced Scene context on the Assembly or
to apply the Assembly context on the Enhanced Scene, after the operation,
all attributes will still be considered overloaded and subsequent
modifications to either the Enhanced Scene or the Assembly will continue
to be independent, one from the other.
Overload Mode Partial
- When you create a Enhanced Scene in Overload Mode Partial, by
default, none of the attributes are considered overloaded.
- Modifications to the Assembly will impact those attributes of the
Enhanced Scene that are not overloaded (so, for example, if you make some
modifications to the Assembly immediately following the Enhanced Scene
creation, all of these modifications will impact the Enhanced Scene).
- Modifications to the Enhanced Scene never impact the Assembly, the
result of such modifications to the Enhanced Scene is to overload the
modified attributes.
- Attributes in the Enhanced Scene are overloaded implicitly when you
modify the attribute in Enhanced Scene context.
Graphical attributes, activation state, hide / show state, and
viewpoint, once modified in the Enhanced Scene, will be considered
overloaded. The overloaded values do not impact the Assembly. These
overloaded attributes will subsequently be independent from the Assembly,
i.e. modifications to the corresponding attributes in the Assembly will
not impact the values of the attributes in the Enhanced Scene.
Position attributes are implicitly overloaded when modified in the
Enhanced Scene, however, you can also overload them explicitly by
selecting the components for which you wish to overload the position and
then clicking the Overload Position icon in the Enhanced Scenes toolbar
(see Overloading
Product Attributes in Enhanced Scene Context).
- If you choose to apply the Enhanced Scene context on the Assembly or
to apply the Assembly context on the Enhanced Scene, after the operation,
those attributes that were considered overloaded will continue to be
considered so (even though they may momentarily have the same value as
the corresponding attribute in the Assembly).
Subsequent modifications of these overloaded attributes in either the
Enhanced Scene or the Assembly will continue to be independent, one from
the other.
Subsequent modifications to the Assembly of those attributes that are
not considered overloaded will continue to impact the Enhanced Scene.
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Applicative Data Available in Enhanced Scene Context
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The following applicative data are
available in the Enhanced Scene context:
- Annotated Views
- 3D Annotation
- Hyperlinks
- Group
- Cumulative snap
- Reset position
- Init position
- Current selection
- Applicative data reordering
- Apply material
- Publish
- Camera
- Cache content
- Modify sag
- DMU Move
- Measure
- Section
- Clash
- Rendering lights
- Rendering Environments
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Note: The automatic update of
Enhanced Scene associated applicative data is managed by a variable in the
DMU Navigator Settings. See Customizing DMU Navigator Settings.
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The Assembly is the Reference for Enhanced Scene Creation
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Enhanced Scene creation always
uses the Assembly as the reference. In Overload Mode Partial, any
modifications to attributes in the Assembly will affect every Enhanced
Scene that does not overload those attributes.
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Therefore, the command Apply Scene
on Assembly will affect all of the Enhanced Scenes with Overload Mode
Partial that have not overloaded the attributes corresponding to those that
will be updated in the Assembly. |
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Propagation of Overloaded Attributes in Enhanced Scene Context
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The propagation of attributes in Enhanced
Scene context will work exactly as in Assembly context. Note, however, that
the propagation of the value of a Product's overloaded attribute to its
children will not cause the child Product's attribute to be considered
overloaded. |
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Save Command in Enhanced Scene Context
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The Save command will be enabled
in Enhanced Scene context, but you should be warned that it is the Assembly
that will be saved (it will be the equivalent of doing Exit Scene
+ Save in Assembly context + Double-clicking the Enhanced Scene
in the specification tree to re-enter the Enhanced Scene). |
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Restrictions
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- In Enhanced Scene context, only products can be UI-Activated.
- Enhanced Scene context is NOT intended for assembly edit (add part,
delete part, geometry modification), its intent is strictly
review-oriented.
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